Assessing and Improving the Mutation Testing Practice of PIT

Thomas Laurent; Mike Papadakis; Marinos Kintis; Christopher Henard; Yves Le Traon; Anthony Ventresque

doi:10.1109/ICST.2017.47

Assessing and Improving the Mutation Testing Practice of PIT

Thomas Laurent
, Mike Papadakis
, Marinos Kintis
, Christopher Henard
, Yves Le Traon
, Anthony Ventresque

University College Dublin
Ecole Centrale de Nantes
University of Luxembourg

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	430-435
Number of pages	6
ISBN (Electronic)	9781509060313
DOIs	https://doi.org/10.1109/ICST.2017.47
State	Published - May 15 2017
Externally published	Yes
Event	10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017 - Tokyo, Japan Duration: Mar 13 2017 → Mar 17 2017

Publication series

Name	Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017

Conference

Conference	10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017
Country/Territory	Japan
City	Tokyo
Period	3/13/17 → 3/17/17

ASJC Scopus Subject Areas

Safety, Risk, Reliability and Quality
Software

Access to Document

10.1109/ICST.2017.47

Cite this

Laurent, T., Papadakis, M., Kintis, M., Henard, C., Traon, Y. L., & Ventresque, A. (2017). Assessing and Improving the Mutation Testing Practice of PIT. In Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017 (pp. 430-435). Article 7927997 (Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICST.2017.47

Assessing and Improving the Mutation Testing Practice of PIT. / Laurent, Thomas; Papadakis, Mike; Kintis, Marinos et al.
Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 430-435 7927997 (Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Laurent, T, Papadakis, M, Kintis, M, Henard, C, Traon, YL & Ventresque, A 2017, Assessing and Improving the Mutation Testing Practice of PIT. in Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017., 7927997, Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017, Institute of Electrical and Electronics Engineers Inc., pp. 430-435, 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017, Tokyo, Japan, 3/13/17. https://doi.org/10.1109/ICST.2017.47

Laurent T, Papadakis M, Kintis M, Henard C, Traon YL, Ventresque A. Assessing and Improving the Mutation Testing Practice of PIT. In Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 430-435. 7927997. (Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017). doi: 10.1109/ICST.2017.47

Laurent, Thomas ; Papadakis, Mike ; Kintis, Marinos et al. / Assessing and Improving the Mutation Testing Practice of PIT. Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 430-435 (Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017).

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Assessing and Improving the Mutation Testing Practice of PIT

Publication series

Conference

ASJC Scopus Subject Areas

Access to Document

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Cite this