Commit-Aware Mutation Testing

Wei Ma; Thomas Laurent; Milos Ojdanic; Thierry Titcheu Chekam; Anthony Ventresque; Mike Papadakis

doi:10.1109/ICSME46990.2020.00045

Commit-Aware Mutation Testing

Wei Ma, Thomas Laurent, Milos Ojdanic, Thierry Titcheu Chekam, Anthony Ventresque, Mike Papadakis

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings - 2020 IEEE International Conference on Software Maintenance and Evolution, ICSME 2020
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	394-405
Number of pages	12
ISBN (Electronic)	9781728156194
DOIs	https://doi.org/10.1109/ICSME46990.2020.00045
State	Published - Sep 2020
Externally published	Yes
Event	36th IEEE International Conference on Software Maintenance and Evolution, ICSME 2020 - Virtual, Adelaide, Australia Duration: Sep 27 2020 → Oct 3 2020

Publication series

Name	Proceedings - 2020 IEEE International Conference on Software Maintenance and Evolution, ICSME 2020

Conference

Conference	36th IEEE International Conference on Software Maintenance and Evolution, ICSME 2020
Country/Territory	Australia
City	Virtual, Adelaide
Period	9/27/20 → 10/3/20

ASJC Scopus Subject Areas

Software
Safety, Risk, Reliability and Quality
Modeling and Simulation

Keywords

mutation testing, change relevant mutants, continuous integration, regression testing

Access to Document

10.1109/ICSME46990.2020.00045

Cite this

Ma, W., Laurent, T., Ojdanic, M., Chekam, T. T., Ventresque, A., & Papadakis, M. (2020). Commit-Aware Mutation Testing. In Proceedings - 2020 IEEE International Conference on Software Maintenance and Evolution, ICSME 2020 (pp. 394-405). Article 9240611 (Proceedings - 2020 IEEE International Conference on Software Maintenance and Evolution, ICSME 2020). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSME46990.2020.00045

Commit-Aware Mutation Testing. / Ma, Wei; Laurent, Thomas; Ojdanic, Milos et al.
Proceedings - 2020 IEEE International Conference on Software Maintenance and Evolution, ICSME 2020. Institute of Electrical and Electronics Engineers Inc., 2020. p. 394-405 9240611 (Proceedings - 2020 IEEE International Conference on Software Maintenance and Evolution, ICSME 2020).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ma, W, Laurent, T, Ojdanic, M, Chekam, TT, Ventresque, A & Papadakis, M 2020, Commit-Aware Mutation Testing. in Proceedings - 2020 IEEE International Conference on Software Maintenance and Evolution, ICSME 2020., 9240611, Proceedings - 2020 IEEE International Conference on Software Maintenance and Evolution, ICSME 2020, Institute of Electrical and Electronics Engineers Inc., pp. 394-405, 36th IEEE International Conference on Software Maintenance and Evolution, ICSME 2020, Virtual, Adelaide, Australia, 9/27/20. https://doi.org/10.1109/ICSME46990.2020.00045

Ma W, Laurent T, Ojdanic M, Chekam TT, Ventresque A, Papadakis M. Commit-Aware Mutation Testing. In Proceedings - 2020 IEEE International Conference on Software Maintenance and Evolution, ICSME 2020. Institute of Electrical and Electronics Engineers Inc. 2020. p. 394-405. 9240611. (Proceedings - 2020 IEEE International Conference on Software Maintenance and Evolution, ICSME 2020). doi: 10.1109/ICSME46990.2020.00045

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title = "Commit-Aware Mutation Testing",

keywords = "mutation testing, change relevant mutants, continuous integration, regression testing",

author = "Wei Ma and Thomas Laurent and Milos Ojdanic and Chekam, {Thierry Titcheu} and Anthony Ventresque and Mike Papadakis",

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year = "2020",

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Commit-Aware Mutation Testing

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

Access to Document

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Cite this