On the impact of timeouts and JVM crashes in Pitest

Thomas Laurent, Fionnuala Wall, Anthony Ventresque

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE 13th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages247-253
Number of pages7
ISBN (Electronic)9781728110752
DOIs
StatePublished - Oct 2020
Externally publishedYes
Event13th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2020 - Porto, Portugal
Duration: Mar 23 2020Mar 27 2020

Publication series

NameProceedings - 2020 IEEE 13th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2020

Conference

Conference13th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2020
Country/TerritoryPortugal
CityPorto
Period3/23/203/27/20

ASJC Scopus Subject Areas

  • Software
  • Safety, Risk, Reliability and Quality
  • Modeling and Simulation

Keywords

  • minimal mutants
  • mutation analysis
  • Pitest

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