PIT-HOM: An extension of pitest for higher order mutation analysis

Thomas Laurent; Anthony Ventresque

doi:10.1109/ICSTW.2019.00036

PIT-HOM: An extension of pitest for higher order mutation analysis

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	83-89
Number of pages	7
ISBN (Electronic)	9781728108889
DOIs	https://doi.org/10.1109/ICSTW.2019.00036
State	Published - Apr 2019
Externally published	Yes
Event	12th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019 - Xi'an, China Duration: Apr 22 2019 → Apr 27 2019

Publication series

Name	Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019

Conference

Conference	12th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019
Country/Territory	China
City	Xi'an
Period	4/22/19 → 4/27/19

ASJC Scopus Subject Areas

Software
Safety, Risk, Reliability and Quality

Keywords

Higher order mutation
Mutation analysis
Pitest
Tool

Access to Document

10.1109/ICSTW.2019.00036

Cite this

Laurent, T., & Ventresque, A. (2019). PIT-HOM: An extension of pitest for higher order mutation analysis. In Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019 (pp. 83-89). Article 8728964 (Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSTW.2019.00036

PIT-HOM: An extension of pitest for higher order mutation analysis. / Laurent, Thomas; Ventresque, Anthony.
Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019. Institute of Electrical and Electronics Engineers Inc., 2019. p. 83-89 8728964 (Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Laurent, T & Ventresque, A 2019, PIT-HOM: An extension of pitest for higher order mutation analysis. in Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019., 8728964, Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019, Institute of Electrical and Electronics Engineers Inc., pp. 83-89, 12th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019, Xi'an, China, 4/22/19. https://doi.org/10.1109/ICSTW.2019.00036

Laurent T, Ventresque A. PIT-HOM: An extension of pitest for higher order mutation analysis. In Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019. Institute of Electrical and Electronics Engineers Inc. 2019. p. 83-89. 8728964. (Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019). doi: 10.1109/ICSTW.2019.00036

Laurent, Thomas ; Ventresque, Anthony. / PIT-HOM : An extension of pitest for higher order mutation analysis. Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019. Institute of Electrical and Electronics Engineers Inc., 2019. pp. 83-89 (Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019).

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title = "PIT-HOM: An extension of pitest for higher order mutation analysis",

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author = "Thomas Laurent and Anthony Ventresque",

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PIT-HOM: An extension of pitest for higher order mutation analysis

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

Access to Document

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Cite this