Re-visiting the coupling between mutants and real faults with Defects4J 2.0

Thomas Laurent, Stephen Gaffney, Anthony Ventresque

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE 14th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages189-198
Number of pages10
ISBN (Electronic)9781665496285
DOIs
StatePublished - 2022
Event14th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2022 - Virtual, Online, Spain
Duration: Apr 4 2022Apr 13 2022

Publication series

NameProceedings - 2022 IEEE 14th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2022

Conference

Conference14th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2022
Country/TerritorySpain
CityVirtual, Online
Period4/4/224/13/22

ASJC Scopus Subject Areas

  • Artificial Intelligence
  • Software
  • Safety, Risk, Reliability and Quality

Keywords

  • Defects4J
  • Fault Detection
  • Mutation Analysis
  • Software Testing

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